发明名称 INSPECTION DEVICE AND INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a technology for suppressing the cost increase and enlargement of a device for detecting the electromagnetic wave and PL light radiated from an inspection object.SOLUTION: The inspection device 100 is a device for inspecting a solar battery 90 as a photo device. The inspection device 100 includes: an irradiation unit 12 for irradiating the solar battery 90 with pulse light LP11 emitted from a femtosecond laser 121 as a light source; an electromagnetic wave detection unit 132 for detecting an electromagnetic wave pulse LT1 emitted from the solar battery 90 in response to the irradiation with the pulse light LP11; and a PL light detection unit 14 for detecting photoluminescence light PL1 emitted by the solar battery 90 in response to the irradiation with the pulse light LP11.
申请公布号 JP2015184170(A) 申请公布日期 2015.10.22
申请号 JP20140061679 申请日期 2014.03.25
申请人 SCREEN HOLDINGS CO LTD;OSAKA UNIV 发明人 NAKANISHI HIDETOSHI;ITO AKIRA;KAWAYAMA IWAO;TOUCHI MASAKICHI
分类号 G01N21/64;G01M11/00;G01N21/00 主分类号 G01N21/64
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