发明名称 |
INSPECTION DEVICE AND INSPECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a technology for suppressing the cost increase and enlargement of a device for detecting the electromagnetic wave and PL light radiated from an inspection object.SOLUTION: The inspection device 100 is a device for inspecting a solar battery 90 as a photo device. The inspection device 100 includes: an irradiation unit 12 for irradiating the solar battery 90 with pulse light LP11 emitted from a femtosecond laser 121 as a light source; an electromagnetic wave detection unit 132 for detecting an electromagnetic wave pulse LT1 emitted from the solar battery 90 in response to the irradiation with the pulse light LP11; and a PL light detection unit 14 for detecting photoluminescence light PL1 emitted by the solar battery 90 in response to the irradiation with the pulse light LP11. |
申请公布号 |
JP2015184170(A) |
申请公布日期 |
2015.10.22 |
申请号 |
JP20140061679 |
申请日期 |
2014.03.25 |
申请人 |
SCREEN HOLDINGS CO LTD;OSAKA UNIV |
发明人 |
NAKANISHI HIDETOSHI;ITO AKIRA;KAWAYAMA IWAO;TOUCHI MASAKICHI |
分类号 |
G01N21/64;G01M11/00;G01N21/00 |
主分类号 |
G01N21/64 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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