发明名称 REFLECTIVE MASK BLANK AND METHOD FOR MANUFACTURING SAME, METHOD FOR MANUFACTURING REFLECTIVE MASK, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 This invention provides a reflective mask blank capable of preventing peeling-off of a multilayer reflective film due to cleaning or the like in a mask manufacturing process or during mask use. The reflective mask blank includes a multilayer reflective film, a protective film, an absorber film, and a resist film formed in this order on a substrate. Assuming that a distance from the center of the substrate to an outer peripheral end of the multilayer reflective film is L(ML), that a distance from the center of the substrate to an outer peripheral end of the protective film is L(Cap), that a distance from the center of the substrate to an outer peripheral end of the absorber film is L(Abs), and that a distance from the center of the substrate to an outer peripheral end of the resist film is L(Res), L(Abs)>L(Res)>L(Cap)≧L(ML) and the outer peripheral end of the resist film is located inward of an outer peripheral end of the substrate.
申请公布号 US2015301441(A1) 申请公布日期 2015.10.22
申请号 US201314418629 申请日期 2013.07.27
申请人 HOYA CORPORATION 发明人 HAMAMOTO Kazuhiro;ASAKAWA Tatsuo;MARUYAMA Osamu;SHOKI Tsutomu
分类号 G03F1/24 主分类号 G03F1/24
代理机构 代理人
主权项
地址 Shinjuku-ku, Tokyo JP