发明名称 |
Apparatuses, systems, devices, and methods of replacing at least partially non-functional portions of memory |
摘要 |
Subject matter disclosed herein relates to determining that a portion of a memory is at least partially non-functional, replacing the portion of at least partially non-functional memory; and adjusting an error detection and/or correction process responsive to determining that the portion of the memory is at least partially non-functional and/or replacing the portion of at least partially non-functional memory. |
申请公布号 |
US9165688(B2) |
申请公布日期 |
2015.10.20 |
申请号 |
US201414454040 |
申请日期 |
2014.08.07 |
申请人 |
Micron Technology, Inc. |
发明人 |
Bueb Chris;Eilert Sean |
分类号 |
H03M13/00;G11C29/00;G06F11/10;G11C29/42;G11C29/52;G11C29/04 |
主分类号 |
H03M13/00 |
代理机构 |
Knobbe Martens Olson and Bear LLP |
代理人 |
Knobbe Martens Olson and Bear LLP |
主权项 |
1. A method for operating a memory device, comprising:
determining if a section of memory is at least partially non-functioning; replacing the section of memory that is at least partially non-functioning with a section of memory which is allocated for storing error codes, wherein replacing the section reduces a total amount of memory available for storing error codes; and wherein, after reduction of the total amount of memory available for storing error codes, the total amount of memory available for storing error codes does not increase. |
地址 |
Boise ID US |