| 摘要 |
The present invention relates to a method for manufacturing a contactor for a semiconductor test. More specifically, the method for manufacturing a contactor for a semiconductor test comprises: a first step of stacking or applying a certain thickness of a mixture in which conductive powder of a conductive material is mixed with silicon to form a mixture sheet; a second step of dividing the mixture sheet into a first area and a second area to irradiate energy onto the first area, and hardening a mixture in the first area to form a conductive pattern; a third step of eliminating a mixture from the second area; a fourth step of injecting silicon into the second area from which the mixture is eliminated; and a fifth step of hardening the silicon injected into the second area. |
