| 摘要 |
一种半导体装置包括：一非挥发性记忆体区块，适用于根据第一控制资讯而输出储存在其所包含的复数个非挥发性记忆胞元中之资料，及根据第二控制资讯而编程在该非挥发性记忆胞元中的资料；一控制区块，适用于根据一初始化讯号而产生该第一控制资讯，其中当一编程模式启动时，该控制区块依序产生该第二控制资讯与该第一控制资讯；以及一测试控制区块，适用于停止该非挥发性记忆体区块，并确认在该第一控制资讯与该第二控制资讯中所包含的复数个控制讯号中是否有至少一个控制讯号在对该编程模式的一测试操作中被正常地产生。; a control block suitable for generating the first control information based on an initialization signal, wherein the control block sequentially generates the second control information and the first control information when a program mode is activated; and a test control block suitable for deactivating the nonvolatile memory block and determining whether at least one control signal among a plurality of control signals included in the first and second control information is normally generated, in a test operation on the program mode. |
