发明名称 Electron microscope sample holder and sample observation method
摘要 The present invention makes it possible, even when using an ordinary electron beam device (not an environment-controlled electron beam device), to create locally a low vacuum condition in the vicinity of a sample and cool said sample by means of a sample holder alone, without modifying the device or adding equipment such as a gas cylinder. The sample to be observed is placed in a sample holder provided with: a vessel that can contain a substance to serve as a gas source; and a through-hole in the bottom of a sample mount on said vessel. Via the through-hole, gas evaporating or volatilizing from the vessel is supplied to the sample under observation, thereby creating a localized low-vacuum state at or in the vicinity of the sample. Also, the heat of vaporization required for volatilization can be used to cool the sample.
申请公布号 US9159530(B2) 申请公布日期 2015.10.13
申请号 US201114002056 申请日期 2011.10.28
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 Hosoya Kotaro;Ohno Masaomi;Hatano Haruhiko
分类号 H01J37/20;H01J37/28 主分类号 H01J37/20
代理机构 Mattingly & Malur, PC 代理人 Mattingly & Malur, PC
主权项 1. A sample holder for an electron microscope for radiating an electron beam on a sample that is placed in a vacuum sample chamber and taking an image of the sample, the sample holder is disposed within the vacuum chamber, the sample holder comprising, a vessel in which a substance for a gas source is stored; a sample stage on which the sample is disposed; a communication hole to supply gas generated from the substance to the sample on the sample stage; and a first cap member covering and sealing the vessel to maintain a vacuum state having a recess portion formed on an upper side of the first cap member, wherein the sample stage is disposed in the recessed portion, wherein the first cap member has a through hole, supplying gas generated from the substance to the sample, bored through a bottom of the recess portion having a diameter smaller than an inner diameter of the recess portion and is a part of the communication, wherein a flow restriction member is disposed inside the recess portion, in the through hole, and below the sample stage, wherein a flow restriction member holder is provided for fixing the flow restriction member at a predetermined position in the recess portion, and wherein a through hole is bored through the flow restriction member through which the gas flows.
地址 Tokyo JP