DEVICE AND METHOD FOR DETECTING POSITION OF SEMICONDUCTOR SUBSTRATE

摘要

Provided is a position detecting device that is capable of precisely detecting the coordinates of the center of a disc-shaped substrate from image data captured by one camera, calculating the amount of positional misalignment of the disc-shaped substrate on a support member as the disc-shaped substrate is being transported during processing, and correcting the position such that the substrate can be located at the precise loading position. Isosceles right triangles, each having the radius of the disc-shaped substrate as one side, are generated from the coordinates of two places on edge data extracted from the image data and the radius on the edge data, and the coordinates of the center position of the disc-shaped substrate are detected by using the Pythagorean theorem.

主权项

1. A position detecting device for detecting a position of a disc-shaped substrate held by a support member movable along a track parallel to Y-axis, said position detecting device comprising:
one imaging camera having cells arranged in an orthogonal XY coordinates system, capturing only a part of a periphery of the disc-shaped substrate within a viewing field of an intersection C at which a straight line passing through a center of the disk-shaped substrate in parallel to Y-axis intersects an edge of the disk-shaped substrate when the support member holding the disc-shaped substrate is positioned at a predetermined monitoring position, said intersection C being a top place in Y axis direction on a circumference of the disc-shaped substrate; an edge extraction section extracting a Y coordinate value of the intersection C from image data of the periphery of the disc-shaped substrate captured by the imaging camera, then extracting XY coordinate values of another place apart from the intersection C on the edge of the disc-shaped substrate captured within a range of the viewing field; and a coordinate detection section detecting coordinates of a center position of the disc-shaped substrate from edge data extracted by the edge extraction section.