发明名称 |
Method for etching a group III nitride semiconductor, method for producing a group III nitride semiconductor crystal, and method for producing a GaN substrate |
摘要 |
A mask layer is formed on a Ga polarity surface of the GaN substrate as a growth substrate. Subsequently, a protective film PF is formed on a N polarity surface of the GaN substrate. Then, a plurality of concave portions is formed from the mask layer extending to the GaN substrate, to thereby form a seed crystal. The seed crystal is etched in a Na melt, and a plurality of concave portions having a facet plane exposed. The seed crystal and the raw materials are placed in a crucible, and the pressure and temperature inside the crucible are increased. Thus, a target GaN layer is grown in the upward direction on the surface of the mask layer and the lateral direction over the concave portions. |
申请公布号 |
US9153439(B2) |
申请公布日期 |
2015.10.06 |
申请号 |
US201414300927 |
申请日期 |
2014.06.10 |
申请人 |
Toyoda Gosei Co., Ltd |
发明人 |
Kumegawa Shohei;Yakushi Yasuhide;Nagai Seiji;Moriyama Miki |
分类号 |
H01L21/02;H01L21/308 |
主分类号 |
H01L21/02 |
代理机构 |
McGinn IP Law Group, PLLC |
代理人 |
McGinn IP Law Group, PLLC |
主权项 |
1. A method for etching a Group III nitride semiconductor, the method comprising:
forming a protective film on a first surface being a N polarity surface of the Group III nitride semiconductor; and etching at least a portion of a second surface of the Group III nitride semiconductor in a melt containing at least Na. |
地址 |
Kiyosu-shi, Aichi-ken JP |