发明名称 Method for etching a group III nitride semiconductor, method for producing a group III nitride semiconductor crystal, and method for producing a GaN substrate
摘要 A mask layer is formed on a Ga polarity surface of the GaN substrate as a growth substrate. Subsequently, a protective film PF is formed on a N polarity surface of the GaN substrate. Then, a plurality of concave portions is formed from the mask layer extending to the GaN substrate, to thereby form a seed crystal. The seed crystal is etched in a Na melt, and a plurality of concave portions having a facet plane exposed. The seed crystal and the raw materials are placed in a crucible, and the pressure and temperature inside the crucible are increased. Thus, a target GaN layer is grown in the upward direction on the surface of the mask layer and the lateral direction over the concave portions.
申请公布号 US9153439(B2) 申请公布日期 2015.10.06
申请号 US201414300927 申请日期 2014.06.10
申请人 Toyoda Gosei Co., Ltd 发明人 Kumegawa Shohei;Yakushi Yasuhide;Nagai Seiji;Moriyama Miki
分类号 H01L21/02;H01L21/308 主分类号 H01L21/02
代理机构 McGinn IP Law Group, PLLC 代理人 McGinn IP Law Group, PLLC
主权项 1. A method for etching a Group III nitride semiconductor, the method comprising: forming a protective film on a first surface being a N polarity surface of the Group III nitride semiconductor; and etching at least a portion of a second surface of the Group III nitride semiconductor in a melt containing at least Na.
地址 Kiyosu-shi, Aichi-ken JP