发明名称 Back scattered electron detector
摘要 It is an object of the present invention to provide a back scattered electron detector suitable for implementing a method for determining beforehand in which region of a sample an X-ray detector can obtain an accurate X-ray detection image and perform an appropriate analysis. A Coax-BSE detector which is a back scattered electron detector includes a BSE element, a support member that supports the BSE element, and a fixing member to fix the support member to the X-ray detector, in which the fixing member fixes the support member by clamping a side portion on the distal end side which is an X-ray receiving side of a housing that covers the X-ray detector.
申请公布号 US9153417(B2) 申请公布日期 2015.10.06
申请号 US201414287016 申请日期 2014.05.24
申请人 TOTOLTD.;Hitachi High-Technologies Corporation 发明人 Aoshima Toshihiro
分类号 H01J37/26;G21K5/04;H01J37/244;H01J37/29;H01J37/28 主分类号 H01J37/26
代理机构 Miles & Stockbridge P.C. 代理人 Miles & Stockbridge P.C.
主权项 1. A back scattered electron detector used together with an X-ray detector included in a charged particle beam apparatus, the charged particle beam apparatus including an another back scattered electron detector arranged between an electron source and a sample and, as seen from the sample, the another back scattered electron detector being arranged on same side as the X-ray detector at a different angle than the X-ray detector, comprising: a reflected electron detection element; a support member that supports the reflected electron detection element; and a fixing member for fixing the support member to the X-ray detector, wherein the fixing member fixes the support member by clamping a side portion on a distal end side, which is an X-ray receiving side, of a housing that covers the X-ray detector.
地址 Kitakyushu-shi JP