| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an inspection device capable of more accurately determining a defective article by grasping the characteristics of an IC chip.SOLUTION: An inspection device 100 configured to inspect an IC chip unit 71 having an IC chip 71a and a loop antenna 71b connected to the IC chip 71a includes: a first frequency oscillation circuit 11a, a second frequency oscillation circuit 11b and a third frequency oscillation circuit 11c for generating inspection signals having a plurality of frequencies; a frequency switching circuit 12 for switching the frequencies of the generated inspection signals; a transmission part 10 for transmitting the inspection signals whose frequencies are switched to the IC chip unit 71 to be inspected; a reception part 30 for receiving the inspection signals transmitted by the transmission part 10, and allowed to pass through the IC chip unit 71; and a determination part 43 for determining the propriety of the IC chip unit 71 on the basis of the inspection signals having the plurality of frequencies received by the reception part 30.</p> |
