发明名称 |
ION BEAM PURITY MONITORING DEVICE, METHOD AND PROGRAM |
摘要 |
PROBLEM TO BE SOLVED: To provide an ion beam purity monitoring technique which makes possible to properly execute the purity monitoring in real time while continuing an output operation.SOLUTION: An ion beam purity monitoring device 30 comprises: an acquisition part 31 operable to take detection data 26 concerning ions emitted in a direction having an angle to a main axis X of an ion beam emitted from a target 12 irradiated with laser; a time counter 32 operable to repeat the counting of time according to the same cycle as that of laser oscillation; an allocation part 33 operable to allocate a signal value of the detection data 26 to a time of counting time; a setting part 35 operable to set a timing corresponding to each charge-to-mass ratio of impurity ions different from an intended ion forming the ion beam; a determination part 36 operable to make determination on whether or not the signal value of the detection data 26 in line with each timing of the impurity ions is above a threshold; and an output part 37 operable to output an abnormality signal on condition that the signal value is determined to be above the threshold. |
申请公布号 |
JP2015176814(A) |
申请公布日期 |
2015.10.05 |
申请号 |
JP20140053832 |
申请日期 |
2014.03.17 |
申请人 |
TOSHIBA CORP |
发明人 |
SUMIYA AKIKO;SAKO TAKAYUKI;SATO KIYOKAZU;KANAI YOSHIHARU |
分类号 |
H01J27/24;H05H7/08;H05H13/04 |
主分类号 |
H01J27/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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