| 摘要 |
<p>A radiation measuring apparatus according to the present invention includes: a detecting unit 201 which detects a scattered radiation that has been generated by Compton scattering which is caused in a scatterer by an incident radiation; and a detecting unit 208 which amplifies a secondary electron that has been generated by a recoil electron which has been generated by the Compton scattering, and detects a trajectory thereof. A measuring unit determines an incoming direction of the incident radiation, from information on a detection result of the scattered radiation and the detection result of the trajectory of the secondary electron. An operation of a power supply 210 is stopped which supplies a voltage for causing an electron avalanche phenomenon to the electron trajectory detecting unit 208, for a predetermined time period which is needed for detecting the trajectories of the secondary electrons.</p> |
