Method and Circuit Unit for Determining Fault States in a Half-Bridge Circuit

摘要

A method is disclosed for determining fault states in a half-bridge circuit having at least a first semiconductor switch and a second semiconductor switch are connected in series with one another and each controllable by a control signal to switch between an open and a closed switching state. For each of the first and second semiconductor switches, an actual switching state and a setpoint switching state are determined. A bridge short circuit in the half-bridge circuit is identified if both (a) the actual switching state of the first semiconductor switch is different than the setpoint switching state of the first semiconductor switch and (b) the actual switching state of the second semiconductor switch is different than the setpoint switching state of the second semiconductor switch.

主权项

1. A method for determining fault states in a half-bridge circuit having at least a first semiconductor switch and a second semiconductor switch, wherein the first semiconductor switch and the second semiconductor switch are connected to one another in a series circuit, wherein each of the first semiconductor switch and the second semiconductor switch is controllable by a control signal to switch between an open switching state and a closed switching state, and wherein the method comprises:
determining an actual switching state and a reference switching state of the first semiconductor switch, determining an actual switching state and a reference switching state of the second semiconductor switch, and detecting a bridge short circuit in the half-bridge circuit in response to determining that (a) the actual switching state of the first semiconductor switch is different from the reference switching state of the first semiconductor switch and (b) the actual switching state of the second semiconductor switch is different from the reference switching state of the second semiconductor switch.