发明名称 Display Panel Characterization System With Flatness and Light Leakage Measurement Capabilities
摘要 A display characterization system may be used to gather display flatness data and light leakage data from a display. The display characterization system may include a camera system that includes flatness measurement cameras and a light leakage measurement camera. The camera system may include a light guide plate covered with a patterned opaque layer or other planar light-emitting structures for emitting patterned light that is reflected from the display. A controller may use the light leakage measurement camera to capture light leakage data while a display backlight unit is on, a reference light source is on, and the planar light-emitting structures are not emitting light. The controller may use the flatness measurement cameras to capture flatness data while the backlight unit is off, the reference light source is off, and the light-emitting structures are reflecting light from the display.
申请公布号 US2015279020(A1) 申请公布日期 2015.10.01
申请号 US201414229649 申请日期 2014.03.28
申请人 Apple Inc. 发明人 Gupta Nathan K.;Goyal Supriya;Demir Veysi;Kessler Patrick;Choi Hyungryul J.
分类号 G06T7/00 主分类号 G06T7/00
代理机构 代理人
主权项 1. A system for characterizing a display, comprising: a support structure in which the display is supported; a camera system that captures flatness data and light leakage data from the display supported by the support structure; and a controller that processes the flatness data and light leakage data.
地址 Cupertino CA US