发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE AND STORAGE MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device having good bondability between a copper film and a base film thereof and having small resistance between wirings. SOLUTION: A substrate (wafer W) having a trench 100 formed on a porous insulating layer (SiOC film 11) containing absorbed moisture in the air is placed in a processing chamber, and the substrate is coated with a first base film (Ti film 13) made of a bubble metal. The surface of the first base film contacting the insulating layer is oxidized by the moisture emitted from the insulating layer to form a passivation film 13a. Meanwhile, the surface of the first base film is coated on a second base film made of a nitride or carbide of the bubble metal, and a copper film 15 is formed on the surface thereof by CVD using a copper organic compound as a material. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008028058(A) |
申请公布日期 |
2008.02.07 |
申请号 |
JP20060197662 |
申请日期 |
2006.07.20 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
KOJIMA YASUHIKO;IKEDA TARO |
分类号 |
H01L21/3205;H01L21/28;H01L21/285;H01L23/52 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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