发明名称 METHOD AND SYSTEM FOR TESTING RFID DEVICES
摘要 <p>A method and system for testing a plurality of RFID devices disposed on a common carrier. In one embodiment, the RFID devices are evenly spaced along the length of the carrier, and the system comprises a short-range tester, a long-range tester and a computer, the short-range tester being coupled to the computer and having a short-range testing position, the long-range tester being coupled to the computer and having a long-range testing position, the long-range testing position being spaced downstream from the short-range testing position by a known number of device positions. In use, an RFID device of interest is first positioned at the short-range testing position, and the short-range tester reads a unique identifier for that RFID device and communicates the identifier to the computer. The carrier is then advanced so that subsequent RFID devices are read by the short-range tester. When the RFID device of interest has advanced to the long-range testing position, the long-range tester conducts a performance test and communicates any detected results to the computer. Because the distance between the two testing positions is known, the computer knows when the RFID device of interest is at the long-range testing position and uses the identifier to distinguish the results for that device from the results of any other devices.</p>
申请公布号 EP1859383(A2) 申请公布日期 2007.11.28
申请号 EP20050855207 申请日期 2005.12.22
申请人 AVERY DENNISON CORPORATION 发明人 PULESTON, DAVID, JOHN;KINGSTON, BENJAMIN, JOHN;FORSTER, IAN, J.
分类号 G06K7/10;G06K7/00 主分类号 G06K7/10
代理机构 代理人
主权项
地址