发明名称 Polishing composition and polishing method
摘要 A polishing composition contains silica abrasive grains and an iodine compound. The silica abrasive grains exhibit a negative zeta potential in the polishing composition. The silica abrasive grains have an average primary particle size of 30 nm or smaller, and the polishing composition has a pH of 4 or lower. The polishing composition is suitable for polishing a polysilicon film and a silicon nitride film.
申请公布号 US2007202703(A1) 申请公布日期 2007.08.30
申请号 US20070711234 申请日期 2007.02.27
申请人 SHIMIZU MIKIKAZU;NAKAJIMA TAKEHIKO 发明人 SHIMIZU MIKIKAZU;NAKAJIMA TAKEHIKO
分类号 H01L21/461;B24B37/00;B24D3/02;B82Y10/00;B82Y99/00;C09K3/14;H01L21/304 主分类号 H01L21/461
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