REFERENCE CONTROL FOR HIGH-SENSITIVITY C-REACTIVE PROTEIN TESTING,申请号EP20020761115-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	REFERENCE CONTROL FOR HIGH-SENSITIVITY C-REACTIVE PROTEIN TESTING
摘要
申请公布号	EP1425006(B1)	申请公布日期	2007.08.29
申请号	EP20020761115	申请日期	2002.07.17
申请人	BIO-RAD LABORATORIES, INC.	发明人	EBRAHIM, ALIREZA;PARIKH, JAYSHREE;VANDERSLICE, WARREN, ERIC
分类号	A61K31/20;C07K1/16;G01N33/48;G01N33/68	主分类号	A61K31/20
代理机构		代理人
主权项
地址

您可能感兴趣的专利

APPARATUS FOR TRANSFERRING THE MACHINE ELEMENT IN THE NACELLE OF WIND TURBINE GENERATOR

APPARATUS AND METHOD FOR ANCHOR STRIP OF LNG STORAGE TANK

ABRASION APPARATUS OF BRUSH CUTTER KNIFE

MARINE VALVE GRINDING ROTATION EQUIPMENT

BENDING APPARATUS FOR MAGNESIUM ALLOY BOARD

OPENING AND CLOSING DEVICE FOR SLIDING WINDOWS OF UNLOCKING THE DEVICE

GASKET WITH SENSOR AND CASK HAVING THE SAME

SPONSORED STORIES UNIT CREATION FROM ORGANIC ACTIVITY STREAM

METHOD FOR THE DETERMINATION OF LONG-TERM OFFSET DRIFTS OF ACCELERATION SENSORS IN MOTOR VEHICLES

FLEXIBLE DEVICE FOR PROVIDING BENDING INTERACTION GUIDE AND CONTROL METHOD THEREOF

Semiconductor die package including multiple dies and a common node structure

COMMON DISTRIBUTOR FOR FUEL CELL

SMART CART SYSTEM

METHOD AND APPARATUS FOR EXPOSING TARGETING ADVERTISEMENT

ARTIFICIAL NAIL AND MANUFACTURING METHOD THEREOF

MANUFACTURING DEVICE FOR CURLED FABRIC

PRIVATE AND PUBLIC APPLICATIONS

SILICON SINGLE-CRYSTAL WAFER PRODUCTION METHOD, AND ANNEALED WAFER

Windlaufverkleidungsanordnung mit einstellbarer Fußstütze