| 摘要 |
A method of inspecting an array substrate which comprises a substrate, a plurality of scanning lines formed on the substrate and extending in a row direction, a plurality of signal lines extending in a columnar direction to intersect the scanning lines, and a plurality of pixel portions formed on the substrate and including switching elements of thin film transistors formed in the vicinity of intersections of the scanning lines and signal lines, auxiliary capacitors and pixel electrodes, the method comprising: inspecting existence of a defect of the array substrate before providing the pixel electrodes on the pixel portions; and inspecting existence of a defect of the array substrate after providing the pixel electrodes on the pixel portions.
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