发明名称 Single wafer thermal CVD processes for hemispherical grained silicon and nano-crystalline grain-sized polysilicon
摘要 Methods for depositing hemispherical grained silicon layers and nanocrystalline grain-sized polysilicon layers are provided. The hemispherical grained silicon layers and nanocrystalline grain-sized polysilicon layers are deposited in single substrate chemical vapor deposition chambers. The hemispherical grained silicon layers and nanocrystalline grain-sized polysilicon layers may be used as electrode layers in semiconductor devices. In one aspect, a two step deposition process is provided to form a nanocrystalline grain-sized polysilicon layer with a reduced roughness.
申请公布号 US2006223333(A1) 申请公布日期 2006.10.05
申请号 US20050099081 申请日期 2005.04.05
申请人 LI MING;CUNNINGHAM KEVIN;PANAYIL SHEEBA;XING GUANGCAI;IYER R S 发明人 LI MING;CUNNINGHAM KEVIN;PANAYIL SHEEBA;XING GUANGCAI;IYER R. S.
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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