| 摘要 |
PROBLEM TO BE SOLVED: To provide systems, methods and apparatus for calibrating a solid-state X-ray detector without projecting an X-ray beam. SOLUTION: The system 100 is constituted of a solid-state X-ray detector 104, and a scrubber 102, bias regulator 106 and flat-field exposure simulator 108 of the solid-state X-ray detector 104. The solid-state X-ray detector 104 is electronically scrubbed, and a flat-field X-ray exposure of the solid-state X-ray detector 104 is simulated, with the adjusted bias of the solid-state X-ray detector 104 as the reference. By the simulation, a gain image 110 of the solid-state X-ray detector 104 is obtained. This gain image is, in turn, used for calibrating the solid-state X-ray detector 104, without projecting the X-ray beam onto the solid-state X-ray detector 104. COPYRIGHT: (C)2007,JPO&INPIT
|
