IMAGE RECORDING METHOD AND DEVICE

摘要

A test pattern is formed on a substrate (F) based on test data supplied from a test data memory (80), and a line width of the test pattern is measured. Mask data is set to have a specified micromirror of a DMD, which constitutes exposure heads (24a-24j), in an off state fixedly at a mask data setting section (86), so that a light quantity is corrected by a line width changing quantity.