发明名称 |
METHOD FOR MANUFACTURING REFLECTIVE PHOTOMASK |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a reflective photomask in which a designed pattern can be embodied correctly to an object by embodying an absorber pattern of the reflective photomask like the designed pattern. <P>SOLUTION: The method for manufacturing the reflective photomask comprises a step of preparing a substrate 100, a step of forming a reflective layer 110 which can reflect an EUVL light onto the substrate 100; a step of forming an oxide layer on the reflective layer 110; a step of forming an oxide pattern which consists of an oxide pattern body and an oxide window defined thereby by patterning the oxide layer; a step of forming an absorber pattern 140 by filling the oxide window with an absorbing material which can absorb the EUVL light; and a step of removing the oxide pattern body. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006229239(A) |
申请公布日期 |
2006.08.31 |
申请号 |
JP20060041522 |
申请日期 |
2006.02.17 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
KIM WOO-JOO;SONG I-HUN;KIM SUK-PIL;CHANG SEUNG-HYUK;RYU GENICHI;KIM HOON |
分类号 |
H01L21/027;G03F1/22;G03F1/24 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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