发明名称 LASER ABLATION APPARATUS, LASER ABLATION METHOD, SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a laser ablation apparatus capable of enhancing the analyzing precision of a sample regardless of a change in the surface state of the sample, and to provide a laser ablation method, a sample analyzer and a sample analyzing method. SOLUTION: The sample analyzer 1 is equipped with a laser ablation unit 3 for irradiating the sample 2 supported on the sample stand 6 in a sample chamber 5 with a laser beam to finely pulverize a part of the sample 2, an element detecting unit 4 for detecting the constituent element contained in the sample 2 and a controller 37. A laser displacement meter 18 for detecting the surface shape of the sample 2 is provided above the sample chamber 5. The controller 37 has a laser control part for controlling a sample stand driving part 7 so as to match the focus of the laser beam with the surface of the sample 2 on the basis of the measured value of the laser displacement meter 18 and an analyzing part for inputting the detected value of the element detecting unit 4 to perform predetermined analyzing processing. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006153660(A) 申请公布日期 2006.06.15
申请号 JP20040344694 申请日期 2004.11.29
申请人 TDK CORP 发明人 OISHI MASAHIRO;KAWASHIMA YASUSHI;FUKUDA KEIICHI
分类号 G01N27/62;G01B11/24;G01N1/28;H01J49/04 主分类号 G01N27/62
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