发明名称 METHOD FOR INSPECTING ACTIVE MATRIX SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide an active matrix substrate, attaining precharge function and inspection function, and to provide a method for inspecting the substrate. SOLUTION: The active matrix substrate comprises a data line drive circuit (101), provided on one end side of a plurality of data lines (35), and an inspection cum precharge circuit (201) provided on the other end side. A releasing or disconnection inspection of the plurality of the data lines is performed (i) by normally operating the data line drive circuit, applying prescribed voltage on a precharge signal line as all of a plurality of precharge switches are turned on and measuring current flowing in a pixel signal line, or (ii) by making the data line drive circuit oparate normally, applying a prescribed voltage on the pixel signal line with all of a plurality of precharge switches, driven simultaneously by a precharge circuit drive signal, turned on, and by measuring the current flowing in the precharge signal line. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005208611(A) 申请公布日期 2005.08.04
申请号 JP20040368856 申请日期 2004.12.21
申请人 SEIKO EPSON CORP 发明人 MURADE MASAO
分类号 G01R31/02;G02F1/13;G02F1/1368;G09F9/00;G09G3/20;G09G3/36;(IPC1-7):G02F1/13;G02F1/136 主分类号 G01R31/02
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