发明名称 PAD AND METHOD FOR CHEMICAL MECHANICAL POLISHING
摘要 <P>PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing pad which is formed with a region that transmits end point detecting light without deteriorating the polishing performance of the polishing pad in chemical mechanical polishing using an optical end point detection device. <P>SOLUTION: The chemical mechanical polishing pad includes a water-insoluble matrix and water-soluble particles dispersed into the water-insoluble matrix, and is formed with a polishing surface and a non-polishing surface opposite to the polishing surface. The polishing pad is formed with a translucent region where light can be transmitted from the polishing surface to the non-polishing surface, and the non-polishing surface in the translucent region has a surface roughness (Ra) of 10 &mu;m or smaller. <P>COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005051234(A) 申请公布日期 2005.02.24
申请号 JP20040208411 申请日期 2004.07.15
申请人 JSR CORP 发明人 SHIHO KOUJI;HOSAKA YUKIO;HASEGAWA TORU;KAWAHASHI NOBUO
分类号 B24B37/013;B24B37/20;B24B37/24;H01L21/304 主分类号 B24B37/013
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