发明名称 |
Sampling methods and systems that shorten readout time and reduce lag in amorphous silicon flat panel x-ray detectors |
摘要 |
Sampling methods and systems that shorten readout time and reduce lag in amorphous silicon flat panel x-ray detectors are described. Embodiments comprise: (a) activating a reset switch to discharge any residual signal being held in a feedback capacitor; (b) deactivating the reset switch; (c) activating a field effect transistor; (d) sampling an electrical signal from the amorphous silicon flat panel x-ray detector, while the field effect transistor is activated; (e) activating a reset switch, after the electrical signal has been sampled and while the field effect transistor is still activated, to discharge any residual signal being held in the feedback capacitor; (f) deactivating the field effect transistor, while the reset switch is still activated; (g) deactivating the reset switch; and (h) repeating steps (c)-(g) as necessary to obtain a predetermined radiographic image.
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申请公布号 |
US2005040352(A1) |
申请公布日期 |
2005.02.24 |
申请号 |
US20030646107 |
申请日期 |
2003.08.22 |
申请人 |
MAOLINBAY MANAT;GRANFORS PAUL;AUFRICHTIG RICHARD;CRONCE RICHARD |
发明人 |
MAOLINBAY MANAT;GRANFORS PAUL;AUFRICHTIG RICHARD;CRONCE RICHARD |
分类号 |
G01T1/20;A61B6/00;G01T1/105;G01T1/29;G03B42/08;H01L27/14;H04N5/32;H04N5/335;(IPC1-7):G03B42/08 |
主分类号 |
G01T1/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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