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发明名称
TESTING DEVICE FOR SEMICONDUCTOR DEVICE
摘要
申请公布号
JPH0232268(A)
申请公布日期
1990.02.02
申请号
JP19880184003
申请日期
1988.07.22
申请人
MITSUBISHI ELECTRIC CORP
发明人
NISHIBASHI RYOJI
分类号
G01R31/26;G01R31/00
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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