发明名称 |
PROCESS FOR PRODUCING MICROSTRUCTURES WITH LOCALLY DIFFERENT STRUCTURAL HEIGHTS |
摘要 |
The invention relates to a process for producing microstructures with locally different structural heights in which: (a) a layer of a positive resist material sensitive to X-radiation is partially irradiated with X-rays using a mask; (b) the irradiated areas are removed with the aid of a developer. The purpose is to propose a process for producing stepped microstructures making step height tolerances in the micrometre range possible. In addition, the microstructures are to be given high solvent resistance and good mechanical properties. The aim is achieved by the invention in that: (c) the layer of the resist material is provided with microstructures on the side towards the radiation before steps (a and b) are performed. |
申请公布号 |
WO9202858(A1) |
申请公布日期 |
1992.02.20 |
申请号 |
WO1991DE00602 |
申请日期 |
1991.07.25 |
申请人 |
KERNFORSCHUNGSZENTRUM KARLSRUHE GMBH;BUERKERT GMBH & CO. |
发明人 |
KOWANZ, BERND;BLEY, PETER;BACHER, WALTER;HARMENING, MICHAEL;MOHR, JUERGEN |
分类号 |
G03F7/26;G02B6/122;G03F1/00;G03F1/22;G03F7/00;G03F7/20;H01L21/027 |
主分类号 |
G03F7/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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