发明名称 Selbstlernmethode für Schaltungstester.
摘要 A self learn technique for a circuit tester such as a manufacturing defect analyser involves grounding each and every node on a known good circuit board, discharging two chosen nodes, applying a stimulus voltage to one of the chosen nodes, removing the grounding from the second chosen node and monitoring the voltage developed on the second node. By comparing the voltage with a threshold value a component can be identified between the nodes. By repeating the procedure over all pairs of nodes the circuit tester can learn component positions and types on the board.
申请公布号 DE3886988(D1) 申请公布日期 1994.02.24
申请号 DE19883886988 申请日期 1988.03.31
申请人 MARCONI INSTRUMENTS LTD., ST. ALBANS, HERTFORDSHIRE, GB 发明人 MATHESON, ROBERT WILLIAM, ST ALBANS HERTFORDSHIRE, GB
分类号 G01R31/02;G01R31/28;G01R31/319;G06F11/25 主分类号 G01R31/02
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