发明名称 |
Selbstlernmethode für Schaltungstester. |
摘要 |
A self learn technique for a circuit tester such as a manufacturing defect analyser involves grounding each and every node on a known good circuit board, discharging two chosen nodes, applying a stimulus voltage to one of the chosen nodes, removing the grounding from the second chosen node and monitoring the voltage developed on the second node. By comparing the voltage with a threshold value a component can be identified between the nodes. By repeating the procedure over all pairs of nodes the circuit tester can learn component positions and types on the board. |
申请公布号 |
DE3886988(D1) |
申请公布日期 |
1994.02.24 |
申请号 |
DE19883886988 |
申请日期 |
1988.03.31 |
申请人 |
MARCONI INSTRUMENTS LTD., ST. ALBANS, HERTFORDSHIRE, GB |
发明人 |
MATHESON, ROBERT WILLIAM, ST ALBANS HERTFORDSHIRE, GB |
分类号 |
G01R31/02;G01R31/28;G01R31/319;G06F11/25 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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