发明名称 APPARATUS AND METHOD FOR INSPECTING LED ARRAY
摘要 An apparatus and Method for Inspecting LED Array are provided to easily inspect a mounting state and deformity of LED by measuring the luminance of the LED array. The test body(100) forms the dark room(110). The LED array of the checking object is mounted in the test tray(200). The test tray is installed in inside and outside of the dark room to move. The light accepting barrel(400) inspects the LED array inside the dark room. The barrel movable part(500) moves the light accepting barrel in the longitudinal direction of the LED array. The opening(120) has a size corresponding to is the shield wall(220) of the test tray.
申请公布号 KR20090087246(A) 申请公布日期 2009.08.17
申请号 KR20080012574 申请日期 2008.02.12
申请人 WOOREE LED 发明人 SHIN, SANG HYUN
分类号 H01L21/66 主分类号 H01L21/66
代理机构 代理人
主权项
地址