发明名称 METHOD FOR MANUFACTURING GROUP III NITRIDE SEMICONDUCTOR CRYSTAL AND GROUP III NITRIDE SEMICONDUCTOR CRYSTAL
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a group III nitride semiconductor crystal having excellent productivity and excellent crystallinity, and to provide a group III nitride semiconductor crystal. <P>SOLUTION: The method for manufacturing a group III nitride semiconductor crystal includes stacking an intermediate layer 12 comprising at least a group III nitride compound on a substrate 11 and forming a film of a group III nitride semiconductor crystal on the intermediate layer 12. The method includes: a pretreatment step of subjecting the substrate 11 to a plasma treatment in a temperature range from 25&deg;C to 1,000&deg;C of the substrate 11 and in a treatment time of from 30 seconds to 3,600 seconds; and a subsequent sputtering step of forming the intermediate layer 12 on the substrate 11 by a sputtering method. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009161434(A) 申请公布日期 2009.07.23
申请号 JP20090024221 申请日期 2009.02.04
申请人 SHOWA DENKO KK 发明人 YOKOYAMA TAISUKE;SAKAI HIROMITSU;MIKI HISAYUKI
分类号 C30B29/38;C23C14/06;C23C16/34;C30B25/18;H01L21/205;H01L33/06;H01L33/32 主分类号 C30B29/38
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