发明名称 EQUALIZER TEST CIRCUIT AND EQUALIZER TEST SIGNAL GENERATION CIRCUIT
摘要 A test circuit to test an equalizer is disclosed. Pseudo-random number data is generated by a pseudo-random number data generation unit. A weight coefficient is generated by a weight coefficient generation unit in order to set interference strength of intersymbol interference. In a pseudo-intersymbol interference data generation unit, pseudo-intersymbol interference is generated according to a bit sequence of the pseudo-random number data, and pseudo-intersymbol interference data is outputted. An amplitude of the pseudo-intersymbol interference data is changed according to the weight coefficient. A driver converts the pseudo-intersymbol interference data into a differential signal. A comparison unit compares the pseudo-random number data generated by the pseudo-random number data generation unit with output data obtained from the equalizer, when the differential signal outputted from the driver is inputted into the equalizer. A count unit counts the number of unmatched data detected by the comparison unit.
申请公布号 US2009185609(A1) 申请公布日期 2009.07.23
申请号 US20090354192 申请日期 2009.01.15
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TAKADA SHUICHI
分类号 H04L27/01 主分类号 H04L27/01
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