发明名称 Flash memory device having a split gate
摘要 A flash memory device having a split gate that can prevent an active region and a floating gate electrode from being misaligned, and a method of manufacturing the same, includes sequentially stacking a gate oxide layer and a floating gate conductive layer on a semiconductor substrate, forming an isolation layer in a predetermined region of the semiconductor substrate where the floating gate conductive layer is formed, and defining an active region. Then, a local oxide layer is formed by oxidizing a predetermined part of the floating gate conductive layer on the active region. A floating gate electrode structure is formed by patterning the floating gate conductive layer using the local oxide layer.
申请公布号 US7564092(B2) 申请公布日期 2009.07.21
申请号 US20060503126 申请日期 2006.08.14
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 RYU EUI-YOUL;KWON CHUL-SOON;KIM JIN-WOO;KIM YONG-HEE;KIM DAI-GEUN;KIM JOO-CHAN
分类号 H01L21/8247;H01L29/76;H01L21/336;H01L27/115;H01L29/423;H01L29/788;H01L29/792 主分类号 H01L21/8247
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