发明名称 SOLID STATE MICROANEMOMETER DEVICE AND METHOD OF FABRICATION
摘要 <p>The invention is a solid state microanemometer and a method of making thereof. Specifically, the invention relates to a microanemometer including an electrically conductive resistor in the form of a semiconductor wafer doped with an impurity having an upper surface, a lower surface having a peripheral edge; a substrate bonded to the semiconductor wafer having an upper surface, a cavity having a peripheral edge and a peripheral margin defined on the upper surface and bounded by the peripheral edge of the cavity wherein the lower surface of the semiconductor wafer rests on and is supported by at least part of the peripheral edge of the cavity such that the semiconductor wafer is over the cavity; and a means for electrically connecting the resistor to a current source. The microanemometer also includes a plurality of metal conductors in contact with the resistor. The semiconductor wafer has sloped sidewalls and the metal conductors are placed on sloped sidewalls of the wafer to effectively increase available active area of the resistor.</p>
申请公布号 WO2009048918(A1) 申请公布日期 2009.04.16
申请号 WO2008US79153 申请日期 2008.10.08
申请人 MEMSYS, INC.;PLOWMAN, THOMAS, E.;JEWETT, WARREN, R. 发明人 PLOWMAN, THOMAS, E.;JEWETT, WARREN, R.
分类号 G01F1/684;G01F1/688;G01F1/692 主分类号 G01F1/684
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