X荧光测厚光谱仪(thick 800),申请号CN200730342879.9-传众专利搜索

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发明名称	X荧光测厚光谱仪(thick 800)
摘要
申请公布号	CN300907999D	申请公布日期	2009.04.15
申请号	CN200730342879.9	申请日期	2007.12.07
申请人	江苏天瑞信息技术有限公司	发明人	刘召贵;应刚;胡晓斌
分类号	10-05	主分类号	10-05
代理机构	深圳市凯达知识产权事务所	代理人	蔡光仟
主权项
地址	215347江苏省昆山市苇城南路1666号清华科技园

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