发明名称 METAL CMP SLURRY COMPOSITIONS USING A NOVEL CORROSION INHIBITOR AND POLISHING METHOD USING THE SAME
摘要 A metal CMP slurry composition is provided to prevent the surface corrosion of polished wafer and the generation of organic residue. A chemical mechanical polishing slurry precursor composition comprises abrasive, complexing agent, anticorrosive agent and liquid carrier. The anticorrosive agent increases open circuit potential of open circuit potential at the state that does not add an anticorrosive agent, to 5-30%. The anticorrosive agent N,N-disubstituted aminomethyl benzotriazole derivative having a structure of the chemical formula (I): T-CH2-NR1R2.
申请公布号 KR20090036985(A) 申请公布日期 2009.04.15
申请号 KR20070102314 申请日期 2007.10.10
申请人 CHEIL INDUSTRIES INC. 发明人 CHOU, HOMER;KIM, WON LAE;NOH, JONG IL;JUNG, YOUNG CHUL;LEE, IN KYUNG
分类号 C09K3/14;H01L21/304 主分类号 C09K3/14
代理机构 代理人
主权项
地址