发明名称 MEMS SCANNING MICROMIRROR WITH REDUCED DYNAMIC DEFORMATION
摘要 <p>A MEMS scanning micromirror with reduced dynamic deformation with a mirror support including a rotation axis beam 120 having a rotation axis 58; a pair of extension bars 56 parallel to the rotation axis 58, each having a first end 140, a midpoint 142, and a second end 144; and a pair of X beams 130, each of the pair of X beams 130 having a cross midpoint 134. One of the pair of X beams 130 is connected to the first end 140 and the midpoint 142 of each of the pair of extension bars 56; the other of the pair of X beams 130 is connected to the midpoint 142 and the second end 144 of each of the pair of extension bars 56; and the rotation axis beam 120 is connected to the cross midpoint 134 of each of the pair of X beams 130.</p>
申请公布号 WO2009044360(A1) 申请公布日期 2009.04.09
申请号 WO2008IB54028 申请日期 2008.10.02
申请人 KONINKLIJKE PHILIPS ELECTRONICS N.V.;KRASTEV, KRASSIMIR, T.;VAN LIEROP, HENDRIKUS, W., L., A., M.;SOEMERS, HERMANUS, M., J., R.;SANDERS, RENATUS, H., M. 发明人 KRASTEV, KRASSIMIR, T.;VAN LIEROP, HENDRIKUS, W., L., A., M.;SOEMERS, HERMANUS, M., J., R.;SANDERS, RENATUS, H., M.
分类号 G02B26/08 主分类号 G02B26/08
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