发明名称 FLASH MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME
摘要 <p>PURPOSE: The flash memory device and manufacturing method thereof is provided so that the charge trap type flash memory device of the structure with an increased program/erase window can be offered. CONSTITUTION: The flash memory device and manufacturing method thereof comprises the substrate(200), insulating layer(210), semiconductor layer(220), selecting transistor and memory cells are included. The insulating layer is formed in the top of the substrate. The semiconductor layer is formed on the insulating layer of the cell region.</p>
申请公布号 KR20100111462(A) 申请公布日期 2010.10.15
申请号 KR20090029906 申请日期 2009.04.07
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SUK GOO
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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