| 摘要 |
A method and a system for defining groups of tests that may be concurrently performed or overlapped are provided. Channel-independent test groups are determined such that each group includes tests that the input/output channels may be utilized simultaneously without conflicts. The channel-independent test groups are divided into block-under-test (BUT) conflict test groups and total-independence test groups. The total-independence test groups may be performed concurrently. Performance of the BUT-conflict test groups may be overlapped such that the input/output channels are used concurrently, but the execution of the tests by the blocks of the device-under-test (DUT) is performed sequentially.
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