发明名称 RADIATION IMAGING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a radiation imaging apparatus which executes appropriate defect correction while improving processing speed. <P>SOLUTION: The radiation imaging apparatus performs radiation imaging by detecting radiation that penetrates an object 2 through a flat panel detector 3. The radiation imaging apparatus has a memory section 42 that stores position information of defect pixels of the flat panel detector 3, which is acquired by calibration, and position information of defect-targeted pixels, a defect determination section 43 that examines defect-targeted pixels when photographing through the flat panel detector 3 based on the position information of defect-targeted pixels, which is stored in the memory section 42, to determine whether or not defects occur in the defect-targeted pixels, and a defect correction section 44 that performs defect correction of the defect-targeted pixels which are determined that defects occur by the defect determination section 43. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010219737(A) 申请公布日期 2010.09.30
申请号 JP20090062629 申请日期 2009.03.16
申请人 SHIMADZU CORP 发明人 SASAKI TAKASHI
分类号 A61B6/00;G01T1/20;G01T1/24;H04N5/335;H04N5/367;H04N5/369 主分类号 A61B6/00
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