发明名称 |
SPACE TRANSFORMER FOR PROBE CARD AND METHOD OF MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a space transformer for a probe card and a method of manufacturing the same.SOLUTION: There is provided a space transformer for a probe card, including: a substrate having a first surface and a second face facing each other; a plurality of first pads formed on the first surface to be spaced apart from each other and connected to a probe; a plurality of second pads formed on the second surface in positions corresponding to those of the first pads and receiving external electrical signals applied thereto; a plurality of via electrodes penetrating through the substrate and connecting between the first and second pads corresponding to each other; a ground layer formed to cover the second surface and provided with a plurality of second pad exposure holes; and an insulating layer formed to cover the ground layer and the plurality of second pads. |
申请公布号 |
JP2013238578(A) |
申请公布日期 |
2013.11.28 |
申请号 |
JP20120175787 |
申请日期 |
2012.08.08 |
申请人 |
SAMSUNG ELECTRO-MECHANICS CO LTD |
发明人 |
OH KWAN-JIE;CHAE YUN-HYOK;KIM BON-GYON;KIM CHE-YON |
分类号 |
G01R31/26;G01R1/06;G01R1/073;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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