DEVICE FOR MEASURING RESONANT INELASTIC X-RAY SCATTERING OF A SAMPLE

摘要

The invention relates to a device for measuring resonant inelastic x-ray scattering of a sample. The device has at least two reflection zone plates (1.RZP, 2.RZP) which are arranged to allow cross-dispersion, a sample to be examined (P) being located in the beam path behind the first reflection zone plate (1.RZP). A second reflection zone plate (2.RZP) disperses the radiation scattered by the sample perpendicular to the dispersion direction of the first reflection zone plate (1.RZP). In the focus of the exiting diffracted radiation of the second reflection zone plate (2.RZP) is arranged a means for two-dimensional detection (D) of the scattered radiation.