发明名称 FUNCTIONAL BUILT-IN SELF TEST FOR A CHIP
摘要 According to one embodiment, a self-test system integrated on a chip is provided, the chip including a functional logic module for performing a selected application. The self-test system includes a primary interface a primary interface to the functional logic module, the primary interface configured to interface with a primary device, an input interface protocol generator for generating a pattern to be inserted into the primary interface and a secondary interface to the functional logic module, the secondary interface configured to interface with a secondary device. The system also includes an emulator engine coupled to the secondary interface, the emulator engine for testing a function of the functional logic module based on the inserted patterns, the function being configured to communicate with a secondary device coupled to the secondary interface, wherein the emulator engine tests the function when no secondary device is coupled to the chip.
申请公布号 US2014156253(A1) 申请公布日期 2014.06.05
申请号 US201213693236 申请日期 2012.12.04
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 McIlvain Kevin M.;Tremaine Robert B.;Van Huben Gary
分类号 G06F11/27 主分类号 G06F11/27
代理机构 代理人
主权项 1. A self-test system integrated on a chip, the chip comprising a functional logic module for performing a selected application, the self-test system comprising: a primary interface to the functional logic module, the primary interface configured to interface with a primary device; an input interface protocol generator for generating a pattern to be inserted into the primary interface; a secondary interface to the functional logic module, the secondary interface configured to interface with a secondary device; an emulator engine coupled to the secondary interface, the emulator engine for testing a function of the functional logic module based on the inserted patterns, the function being configured to communicate with the secondary device, wherein the emulator engine tests the function when the secondary device is not coupled to the chip; an emulator checker in the emulator engine configured to determine that an input received by the emulator engine from the secondary interface is correct, the input generated by the functional logic module based on the inserted patterns, wherein the emulator engine is further configured to generate an output to the functional logic module based on the input and the testing of the function; and an output interface protocol payload checker coupled to the primary interface for determining that a response received from the primary interface is correct by comparing the response to an expected result, the response provided by the functional logic module based on the output generated by the emulator engine.
地址 Armonk NY US