| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a technology for measuring a refractive index.SOLUTION: A microscope system 100 comprises: a wavefront modulator 2 that modulates a wavefront of light from a laser 1; an objective lens 9 that emits light having the wavefront modulated by the wavefront modulator 2 to a specimen S; a correction ring 10 that corrects a spherical aberration arising from a difference between a refractive index of a medium between the objective lens 9 and the specimen S and a refractive index of the specimen S; refractive index calculation means for, for each wavelength of the light from the laser 1, calculating an average refractive index of a medium between the objective lens 9 and a condensing position of the light emitted from the objective lens 9 on the basis of a correction amount of the spherical aberration by the correction ring 10; and control means for controlling the wavefront modulator 2 so as to correct a chromatic aberration to be calculated on the basis of the average refractive index for each wavelength calculated by the refractive index calculation means.</p> |
