发明名称 SOLID STATE IMAGING APPARATUS USED FOR THREE-DIMENSIONAL SHAPE MEASUREMENT
摘要 <p>PROBLEM TO BE SOLVED: To provide a solid state imaging apparatus used for a three-dimensional measurement apparatus which, in three-dimensional shape measurement of a measurement object, is capable of shortening a time for the measurement and reducing a data amount for calculating three-dimensional data from an image acquired by an imaging apparatus.SOLUTION: When irradiating a measurement object with sheet light and acquiring its image with an MOS-type solid state imaging apparatus, a row output circuit determines pixels irradiated with the sheet light and including three-dimensional information and pixels not including the information, and a pixel circuit effectively performs row output. Rows determined to include no three-dimensional information by the row output circuit are not read out and only rows including the three-dimensional information are read out.</p>
申请公布号 JP2015027019(A) 申请公布日期 2015.02.05
申请号 JP20130156472 申请日期 2013.07.29
申请人 ROSNES:KK;UNIV OF TOKYO 发明人 IKEDA MAKOTO;OTA SOGO;YAMAGUCHI TAKUMI
分类号 H04N5/345;H04N5/374 主分类号 H04N5/345
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