发明名称 PROBE AND PROBE MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a probe capable of being manufactured at low cost and having a spring function.SOLUTION: The probe is formed with a tip part 10, a spring part 20, a casing part 30, and a casing connection part 40. The tip of the tip part is bent into an L shape to form a terminal contact part 11. This terminal contact part is a portion which comes into contact with and is electrically connected with an electrode pad or an electrode terminal in an electric circuit or an electronic component, etc., to be inspected. The spring part assumes a structure in which a shape, being planar and meandering, both sides of which are bent into a U shape, is folded into a U shape along the longitudinal direction at approximately the center portion, one side 21 and the other side 22 of the folded shape being substantially parallel. The spring part 20 has elasticity as both sides thereof assume a meandering shape bent into a U shape, so that it can exhibit functionality as a spring.
申请公布号 JP2015045649(A) 申请公布日期 2015.03.12
申请号 JP20140203615 申请日期 2014.10.02
申请人 FUJITSU COMPONENT LTD 发明人 SATO KIMINORI;MIKI YASUYUKI;HARADA KEITA;KOBAYASHI MITSURU;MIYAZAWA HIDEO;TAKAHASHI YUKINORI
分类号 G01R1/067;H01L21/66 主分类号 G01R1/067
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