发明名称 Nanostructure-based vacuum channel transistor
摘要 A vacuum field effect, nanostructure-based transistor (VFET) that operates at pressures as high as 101 kPa, with an operating voltage magnitude as low as about 2 Volts and has a cutoff frequency as high as 0.46 THz, and has an electrode separation gap distance of about 150 nm or less.
申请公布号 US9147755(B1) 申请公布日期 2015.09.29
申请号 US201414249238 申请日期 2014.04.09
申请人 发明人 Han Jin-Woo;Meyyappan Meyya
分类号 H01L21/00;H01L29/66;H01L29/78;H01L29/417;H01L29/49;H01L29/423;H01L21/28;H01L21/3215;H01L21/02 主分类号 H01L21/00
代理机构 代理人 Schipper John F.;Padilla Robert M.
主权项 1. A method for producing a vacuum field effect transistor, the method comprising: providing first and second electrodes, approximately parallel, having lengths, Le1 and Le2, no greater than about 25 nm and 25 nm, respectively, and being separated by a positive gap distance d12 that is no greater than about 150 nm, where each of the first and second electrodes is produced by plasma ashing of a line of photoresist having a selected line length no greater than about 20 nm, and where the first and second electrodes have a voltage difference V12 that is non-zero and is no greater than about 10 Volts; positioning an insulator gate, having a width wg that is no greater than about d12/2 and having a gate length Lg greater than a maximum of Le1 and Le2, between the first and second electrodes, where the gate is separated by an approximately equal distance from the first and second electrodes; providing the gate with a variable gate voltage Vg that can be controllably varied between Vg(min)<2 Volts and Vg(max)>2 Volts; and operating the first and second electrodes and the gate in an inert gas at a pressure up to about 101 kPa.
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