发明名称 |
Nanostructure-based vacuum channel transistor |
摘要 |
A vacuum field effect, nanostructure-based transistor (VFET) that operates at pressures as high as 101 kPa, with an operating voltage magnitude as low as about 2 Volts and has a cutoff frequency as high as 0.46 THz, and has an electrode separation gap distance of about 150 nm or less. |
申请公布号 |
US9147755(B1) |
申请公布日期 |
2015.09.29 |
申请号 |
US201414249238 |
申请日期 |
2014.04.09 |
申请人 |
|
发明人 |
Han Jin-Woo;Meyyappan Meyya |
分类号 |
H01L21/00;H01L29/66;H01L29/78;H01L29/417;H01L29/49;H01L29/423;H01L21/28;H01L21/3215;H01L21/02 |
主分类号 |
H01L21/00 |
代理机构 |
|
代理人 |
Schipper John F.;Padilla Robert M. |
主权项 |
1. A method for producing a vacuum field effect transistor, the method comprising:
providing first and second electrodes, approximately parallel, having lengths, Le1 and Le2, no greater than about 25 nm and 25 nm, respectively, and being separated by a positive gap distance d12 that is no greater than about 150 nm, where each of the first and second electrodes is produced by plasma ashing of a line of photoresist having a selected line length no greater than about 20 nm, and where the first and second electrodes have a voltage difference V12 that is non-zero and is no greater than about 10 Volts; positioning an insulator gate, having a width wg that is no greater than about d12/2 and having a gate length Lg greater than a maximum of Le1 and Le2, between the first and second electrodes, where the gate is separated by an approximately equal distance from the first and second electrodes; providing the gate with a variable gate voltage Vg that can be controllably varied between Vg(min)<2 Volts and Vg(max)>2 Volts; and operating the first and second electrodes and the gate in an inert gas at a pressure up to about 101 kPa. |
地址 |
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