发明名称 METAL-SEMICONDUCTOR PHASE TRANSITION MATERIAL
摘要 <p>PROBLEM TO BE SOLVED: To provide a material in which metal-semiconductor phase transition behavior represented by a light control function is high.SOLUTION: Provided is a metal-semiconductor phase transition material in which a low temperature phase as a semiconductor phase includes VOas an R phase,and further, upon measurement by aθ-2θX-ray diffraction method using CuKαas a radiation source, 2θhas diffraction peaks at the positions within the range of 19.5 to 20°,within the range of 29.5 to 30.2°,within the range of 40.0 to 40.5°,within the range of 46.5 to 47.0° and within the range of 62.0 to 62.5.</p>
申请公布号 JP2015168589(A) 申请公布日期 2015.09.28
申请号 JP20140042387 申请日期 2014.03.05
申请人 TDK CORP 发明人 KIKUKAWA TAKASHI;KAWAGUCHI YUICHI
分类号 C01G31/02 主分类号 C01G31/02
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