TESTING OF ELECTRONIC DEVICES

摘要

There is provided testing of an electronic device. A set of test cases is acquired. Each test case represents a sequence of instructions for the electronic device to act on and to generate responses to. The test cases are divided into K > 1 batches, each of length m, of test cases at least based four parameters. A test routine is performed for each batch i, i=i...K in turn. The test routine involves instructing the electronic device to perform an action based on test cases in batch i. The test routine involves monitoring any results associated with the test cases in batch i from the electronic device as provided in at least one monitoring event. The test routine involves forcing the electronic device into an initial state between each batch of test cases.